Batista, Luana, Badri, Bechir, Sabourin, Robert and Thomas, Marc.
2012.
« Detecting bearing defects under high noise levels: A classifier fusion approach ».
In 38th Annual Conference on IEEE Industrial Electronics Society, IECON 2012 (Montreal, QC, Canada, Oct. 25-28, 2012)
pp. 3880-3886.
Washington, DC : IEEE Computer Society.
Compte des citations dans Scopus : 6.
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Official URL: http://dx.doi.org/10.1109/IECON.2012.6389272
Item Type: | Conference proceeding |
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Professor: | Professor Sabourin, Robert Thomas, Marc |
Affiliation: | Génie de la production automatisée, Génie mécanique |
Date Deposited: | 24 Jul 2013 20:44 |
Last Modified: | 19 Oct 2023 16:29 |
URI: | https://espace2.etsmtl.ca/id/eprint/5234 |
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