Quick Profiler (QuiP) : a friendly tool to extract roughness statistical parameters using a needle profiler

Trudel, Mélanie, Charbonneau, François, Avendano, Fernando et Leconte, Robert. 2010. « Quick Profiler (QuiP) : a friendly tool to extract roughness statistical parameters using a needle profiler ». Canadian Journal of Remote Sensing = Journal Canadien de Télédétection, vol. 36, nº 4. pp. 391-396.
Compte des citations dans Scopus : 12.

The full text of this document is not available here.

Item Type:	Peer reviewed article published in a journal
Professor:	Professor Leconte, Robert
Affiliation:	Génie de la construction
Date Deposited:	23 May 2012 17:56
Last Modified:	23 May 2012 17:56
URI:	https://espace2.etsmtl.ca/id/eprint/543

Actions (login required)

View Item