Thibeault, Claude, Hariri, Y., Hasan, S. R., Hobeika, C., Savaria, Y., Audet, Y. and Tazi, F. Z..
2013.
« A library-based early soft error sensitivity analysis technique for SRAM-based FPGA design ».
Journal of Electronic Testing: Theory and Applications, vol. 29, nº 4.
pp. 457-471.
Compte des citations dans Scopus : 13.
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Official URL: http://dx.doi.org/10.1007/s10836-013-5393-9
Item Type: | Peer reviewed article published in a journal |
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Professor: | Professor Thibeault, Claude |
Affiliation: | Génie électrique |
Date Deposited: | 12 Dec 2013 20:09 |
Last Modified: | 12 May 2016 14:24 |
URI: | https://espace2.etsmtl.ca/id/eprint/6283 |
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