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A library-based early soft error sensitivity analysis technique for SRAM-based FPGA design

Thibeault, Claude, Hariri, Y., Hasan, S. R., Hobeika, C., Savaria, Y., Audet, Y. et Tazi, F. Z.. 2013. « A library-based early soft error sensitivity analysis technique for SRAM-based FPGA design ». Journal of Electronic Testing: Theory and Applications, vol. 29, nº 4. pp. 457-471.
Compte des citations dans Scopus : 11.

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Item Type: Peer reviewed article published in a journal
Professor:
Professor
Thibeault, Claude
Affiliation: Génie électrique
Date Deposited: 12 Dec 2013 20:09
Last Modified: 12 May 2016 14:24
URI: https://espace2.etsmtl.ca/id/eprint/6283

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