Using Fourier analyses to enhance IC testability

Thibeault, Claude. 1994. « Using Fourier analyses to enhance IC testability ». In IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems (Los Alamitos, CA, USA, Oct. 17-19, 1994) pp. 280-288. IEEE Computer Society Press.
Compte des citations dans Scopus : 5.

The full text of this document is not available here.

Item Type:	Conference proceeding
Professor:	Professor Thibeault, Claude
Affiliation:	Génie électrique
Date Deposited:	27 Mar 2014 16:00
Last Modified:	27 Mar 2014 16:00
URI:	https://espace2.etsmtl.ca/id/eprint/7337

Actions (login required)

View Item