Multi-abstraction level signature generation and comparison based on radiation single event upset

Hobeika, C., Pichette, S., Leonard, M. A., Thibeault, Claude, Boland, Jean-François and Audet, Y.. 2014. « Multi-abstraction level signature generation and comparison based on radiation single event upset ». In 2014 IEEE 20th International On-Line Testing Symposium (IOLTS) (Platja d'Aro, Girona, Spain, July 7-9, 2014) pp. 212-215. Piscataway, N. J., USA : IEEE.
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Item Type:	Conference proceeding
ISBN:	978-1-4799-5324-0
Professor:	Professor Thibeault, Claude Boland, Jean-François
Affiliation:	Génie électrique
Date Deposited:	12 Sep 2014 18:52
Last Modified:	05 Apr 2018 15:08
URI:	https://espace2.etsmtl.ca/id/eprint/8465

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