Gorse, N., Metzger, M., Lapalme, J., Aboulhamid, E. M., Savaria, Y. and Nicolescu, G..
2004.
« Enhancing ESys.Net with a semi-formal verification layer ».
In 16th International Conference on Microelectronics, ICM 2004 Proceedings (Tunis, Tunisia, Dec. 6-8, 2004)
pp. 388-391.
IEEE.
Compte des citations dans Scopus : 4.
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Official URL: http://dx.doi.org/10.1109/ICM.2004.1434594
Item Type: | Conference proceeding |
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Professor: | Professor Lapalme, James |
Affiliation: | Autres |
Date Deposited: | 10 Oct 2014 15:21 |
Last Modified: | 10 Oct 2014 15:21 |
URI: | https://espace2.etsmtl.ca/id/eprint/8721 |
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