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Some results on yield and local design rule relaxation

Crépeau, J., Thibeault, Claude et Savaria, Y.. 1993. « Some results on yield and local design rule relaxation ». In Proceedings. The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems (Venice, Italy, Oct. 27-29, 1993), pp. 144-151. Los Alamitos, CA, USA : Institute of Electrical and Electronics Engineers (IEEE).

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Item Type: Conference proceeding
Professor:
Professor
Thibeault, Claude
Affiliation: Génie électrique
Date Deposited: 23 Dec 2014 14:55
Last Modified: 23 Dec 2014 14:55
URI: https://espace2.etsmtl.ca/id/eprint/9128

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