Gagnon, Yves, Savaria, Yvon, Meunier, Michel and Thibeault, Claude.
1997.
« Are defect-tolerant circuits with redundancy really cost-effective? Complete and realistic cost model ».
In 1997 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 1997. Proceedings (Paris, France, Oct. 20-22, 1997)
pp. 157-165.
Piscataway, NJ, USA : IEEE.
Compte des citations dans Scopus : 8.
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Official URL: http://dx.doi.org/10.1109/DFTVS.1997.628321
Item Type: | Conference proceeding |
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Professor: | Professor Thibeault, Claude |
Affiliation: | Génie électrique |
Date Deposited: | 23 Dec 2014 14:55 |
Last Modified: | 23 Dec 2014 14:55 |
URI: | https://espace2.etsmtl.ca/id/eprint/9143 |
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