Thibeault, C. et Payeur, A..
1995.
« FFT-based test of a yield monitor circuit ».
In Proceedings, the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems (Lafayette, LA, USA, Nov. 13-15, 1995)
pp. 243-251.
IEEE.
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Official URL: http://dx.doi.org/10.1109/DFTVS.1995.476958
Item Type: | Conference proceeding | ||
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Affiliation: | Génie électrique | ||
Date Deposited: | 23 Dec 2014 14:55 | ||
Last Modified: | 23 Dec 2014 14:55 | ||
URI: | https://espace2.etsmtl.ca/id/eprint/9233 |
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