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FFT-based test of a yield monitor circuit

Thibeault, C. et Payeur, A.. 1995. « FFT-based test of a yield monitor circuit ». In Proceedings, the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems (Lafayette, LA, USA, Nov. 13-15, 1995), pp. 243-251. IEEE.

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Item Type: Conference proceeding
Professor:
Professor
Thibeault, Claude
Affiliation: Génie électrique
Date Deposited: 23 Dec 2014 14:55
Last Modified: 23 Dec 2014 14:55
URI: https://espace2.etsmtl.ca/id/eprint/9233

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