FFT-based test of a yield monitor circuit

Thibeault, C. et Payeur, A.. 1995. « FFT-based test of a yield monitor circuit ». In Proceedings, the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems (Lafayette, LA, USA, Nov. 13-15, 1995), pp. 243-251. IEEE.

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Official URL: http://dx.doi.org/10.1109/DFTVS.1995.476958

Item Type:

Conference proceeding

Professor:

Professor
Thibeault, Claude

Affiliation:

Génie électrique

Date Deposited:

23 Dec 2014 14:55

Last Modified:

23 Dec 2014 14:55

URI:

https://espace2.etsmtl.ca/id/eprint/9233

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