FRANÇAIS
A showcase of ÉTS researchers’ publications and other contributions
SEARCH

On extra delays affecting I/O blocks of an SRAM-based FPGA due to ionizing radiation

Tazi, F. Z., Thibeault, Claude, Savaria, Y., Pichette, S. et Audet, Y.. 2014. « On extra delays affecting I/O blocks of an SRAM-based FPGA due to ionizing radiation ». IEEE Transactions on Nuclear Science, vol. 61, nº 6. pp. 3138-3145.
Compte des citations dans Scopus : 8.

The full text of this document is not available here.
Rechercher dans Google Scholar
Item Type: Peer reviewed article published in a journal
Professor:
Professor
Thibeault, Claude
Affiliation: Génie électrique
Date Deposited: 25 Feb 2015 21:50
Last Modified: 25 Feb 2015 21:50
URI: https://espace2.etsmtl.ca/id/eprint/9385

Actions (login required)

View Item View Item