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A probabilistic model to learn, detect, localize and classify patterns in arbitrary images

Toews, Matthew. 2008. « A probabilistic model to learn, detect, localize and classify patterns in arbitrary images ». These. Montreal, McGill University, 183 p.

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Item Type: Dissertation or these (These)
Professor:
Professor
Toews, Matthew
Affiliation: Autres
Date Deposited: 25 Jun 2015 15:36
Last Modified: 01 Oct 2015 20:44
URI: https://espace2.etsmtl.ca/id/eprint/9734

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