Toews, Matthew. 2008. « A probabilistic model to learn, detect, localize and classify patterns in arbitrary images ». These. Montreal, McGill University, 183 p.
The full text of this document is not available here.
Rechercher dans Google Scholar
Official URL: http://digitool.Library.McGill.CA:80/R/-?func=dbin...
Item Type: | Dissertation or these (These) |
---|---|
Professor: | Professor Toews, Matthew |
Affiliation: | Autres |
Date Deposited: | 25 Jun 2015 15:36 |
Last Modified: | 01 Oct 2015 20:44 |
URI: | https://espace2.etsmtl.ca/id/eprint/9734 |
Actions (login required)
![]() |
View Item |