Toews, M. et Arbel, T..
2003.
« Entropy-of-likelihood feature selection for image correspondence ».
In Ninth IEEE International Conference on Computer Vision, 2003. Proceedings (Nice, France, Oct. 13-16, 2003)
pp. 1041-1047.
Piscataway, NJ, USA : Institute of Electrical and Electronics Engineers Inc..
Compte des citations dans Scopus : 12.
Rechercher dans Google Scholar
Official URL: http://dx.doi.org/10.1109/ICCV.2003.1238464
| Item Type: | Conference proceeding |
|---|---|
| Professor: | Professor Toews, Matthew |
| Affiliation: | Autres |
| Date Deposited: | 25 Jun 2015 15:40 |
| Last Modified: | 15 Apr 2016 14:55 |
| URI: | https://espace2.etsmtl.ca/id/eprint/9743 |
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