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Inspection of metallic surfaces using Local Binary Patterns

Mansano, M., Pavesi, L., Oliveira, L. S., Britto Jr, A. et Koerich, A.. 2011. « Inspection of metallic surfaces using Local Binary Patterns ». In 37th Annual Conference of the IEEE Industrial Electronics Society, IECON 2011, November 7, 2011 - November 10, 2011 (Melbourne, VIC, Australia, Nov. 7-10, 2011) Coll. « IECON Proceedings (Industrial Electronics Conference) » pp. 2227-2231. Melbourne, VIC, Australia : IEEE Computer Society.
Compte des citations dans Scopus : 6.

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Item Type: Conference proceeding
Professor:
Professor
Lameiras Koerich, Alessandro
Affiliation: Autres
Date Deposited: 07 Jul 2015 15:59
Last Modified: 09 Feb 2016 21:02
URI: https://espace2.etsmtl.ca/id/eprint/9848

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