Inspection of metallic surfaces using Local Binary Patterns

Mansano, M., Pavesi, L., Oliveira, L. S., Britto Jr, A. and Koerich, A.. 2011. « Inspection of metallic surfaces using Local Binary Patterns ». In 37th Annual Conference of the IEEE Industrial Electronics Society, IECON 2011, November 7, 2011 - November 10, 2011 (Melbourne, VIC, Australia, Nov. 7-10, 2011) Coll. « IECON Proceedings (Industrial Electronics Conference) » pp. 2227-2231. Melbourne, VIC, Australia : IEEE Computer Society.
Compte des citations dans Scopus : 10.

The full text of this document is not available here.

Item Type:	Conference proceeding
Professor:	Professor Lameiras Koerich, Alessandro
Affiliation:	Autres
Date Deposited:	07 Jul 2015 15:59
Last Modified:	09 Feb 2016 21:02
URI:	https://espace2.etsmtl.ca/id/eprint/9848

Actions (login required)

View Item