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On a new outlier rejection technique

Thibeault, Claude. 2007. « On a new outlier rejection technique ». In IEEE VLSI Test Symposium (Berkeley, CA, USA, May 6-10, 2007), pp. 97-103. Piscataway, NJ, USA : Institute of Electrical and Electronics Engineers Computer Society.

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Item Type: Conference proceeding
Professor:
Professor
Thibeault, Claude
Affiliation: Génie électrique
Date Deposited: 30 Oct 2012 18:19
Last Modified: 30 Oct 2012 18:19
URI: http://espace2.etsmtl.ca/id/eprint/2943

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