FRANÇAIS
A showcase of ÉTS researchers’ publications and other contributions
SEARCH

Automatic verification methodology based on structural test patterns

Hobeika, Christelle and Thibeault, Claude and Boland, Jean-François. 2009. « Automatic verification methodology based on structural test patterns ». Affiche présentée lors de la conférence : 27th VLSI Test Symposium (IEEE VTS) (Santa Cruz, Calif., USA, May 3-7, 2009).

The full text of this document is not available here.
Item Type: Poster
Additional Information: Honneur : Best Student Poster Award
Professor:
Professor
Thibeault, Claude
Boland, Jean-François
Affiliation: Génie électrique
Date Deposited: 18 Apr 2013 19:01
Last Modified: 05 Apr 2018 15:08
URI: http://espace2.etsmtl.ca/id/eprint/3975

Actions (login required)

View Item View Item