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A novel probabilistic approach for IC diagnosis based on differential quiescent current signatures

Thibeault, Claude. 1997. « A novel probabilistic approach for IC diagnosis based on differential quiescent current signatures ». In 15th IEEE VLSI Test Symposium (Monterey, CA, USA, Apr. 27-May 1, 1997), pp. 80-85. Los Alamitos, CA, USA : Institute of Electrical and Electronics Engineers Computer Society.

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Item Type: Conference proceeding
Professor:
Professor
Thibeault, Claude
Affiliation: Génie électrique
Date Deposited: 18 Apr 2013 19:04
Last Modified: 18 Apr 2013 19:04
URI: http://espace2.etsmtl.ca/id/eprint/4715

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