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Tolerance control with high resolution 3D measurements

Prieto, Flavio, Redarce, Tanneguy, Boulanger, Pierre et Lepage, Richard. 2001. « Tolerance control with high resolution 3D measurements ». In 3ird International Conference on 3-D Digital Imaging and Modeling (Quebec, QC, Canada, May 28-June 1, 2001), pp. 339-346. Los Alamitos, CA, USA : Institute of Electrical and Electronics Engineers Computer Society.
Compte des citations dans Scopus : 6.

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Item Type: Conference proceeding
Professor:
Professor
Lepage, Richard
Affiliation: Génie de la production automatisée
Date Deposited: 24 Jul 2013 20:42
Last Modified: 24 Jul 2013 20:42
URI: http://espace2.etsmtl.ca/id/eprint/4957

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