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Tools for the characterization of bipolar CML testability

Monte, Ginette, Antaki, Bernard, Patenaude, Serge, Savaria, Yvon, Thibeault, Claude et Trouborst, Pieter. 2001. « Tools for the characterization of bipolar CML testability ». In 19th IEEE VLSI Test Symposium (VTS) (Marina Del Rey, CA, USA, Apr. 29-May 3, 2001), pp. 388-395. Los Alamitos, CA, USA : Institute of Electrical and Electronics Engineers Computer Society.
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Item Type: Conference proceeding
Professor:
Professor
Thibeault, Claude
Affiliation: Génie électrique
Date Deposited: 24 Jul 2013 20:42
Last Modified: 24 Jul 2013 20:42
URI: http://espace2.etsmtl.ca/id/eprint/4974

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