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Detection and location of faults and defects using digital signal processing

Thibeault, Claude. 1995. « Detection and location of faults and defects using digital signal processing ». In Proceedings 13th IEEE VLSI Test Symposium (Los Alamitos, CA, USA, Apr. 30-May 3, 1995), pp. 262-267. IEEE Computer Society Press.
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Item Type: Conference proceeding
Professor:
Professor
Thibeault, Claude
Affiliation: Génie électrique
Date Deposited: 27 Mar 2014 15:59
Last Modified: 27 Mar 2014 15:59
URI: https://espace2.etsmtl.ca/id/eprint/7334

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