Trudel, Sylvie et Abran, Alain.
2009.
« Functional size measurement quality challenges for inexperienced measurers ».
In Software Process and Product Measurement : International Conferences IWSM 2009 and Mensura 2009 Amsterdam, The Netherlands, November 4-6, 2009. Proceedings (Amsterdam, The Netherlands, Nov. 4-6, 2009) Coll. « Lecture Notes in Computer Science », vol. 5891.
, pp. 157-169.
Springer Berlin Heidelberg.
Compte des citations dans Scopus : 4.
The full text of this document is not available here.
| Item Type: |
Conference proceeding
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| Editors: |
| Abran, Alain | UNSPECIFIED | | Braungarten, René | UNSPECIFIED | | Dumke, Reiner R. | UNSPECIFIED | | Cuadrado-Gallego, Juan J. | UNSPECIFIED | | Brunekreef, Jacob | UNSPECIFIED |
|
| Professor: |
|
| Affiliation: |
Génie logiciel et des technologies de l'information |
| Date Deposited: |
11 Aug 2015 20:45 |
| Last Modified: |
11 Aug 2015 20:45 |
| URI: |
https://espace2.etsmtl.ca/id/eprint/10273 |
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