Functional size measurement quality challenges for inexperienced measurers

Trudel, Sylvie et Abran, Alain. 2009. « Functional size measurement quality challenges for inexperienced measurers ». In Software Process and Product Measurement : International Conferences IWSM 2009 and Mensura 2009 Amsterdam, The Netherlands, November 4-6, 2009. Proceedings (Amsterdam, The Netherlands, Nov. 4-6, 2009) Coll. « Lecture Notes in Computer Science », vol. 5891. pp. 157-169. Springer Berlin Heidelberg.
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Item Type:	Conference proceeding
ISBN:	978-3-642-05414-3
Editors:	Editors ORCID Abran, Alain UNSPECIFIED Braungarten, René UNSPECIFIED Dumke, Reiner R. UNSPECIFIED Cuadrado-Gallego, Juan J. UNSPECIFIED Brunekreef, Jacob UNSPECIFIED
Professor:	Professor Abran, Alain
Affiliation:	Génie logiciel et des technologies de l'information
Date Deposited:	11 Aug 2015 20:45
Last Modified:	11 Aug 2015 20:45
URI:	https://espace2.etsmtl.ca/id/eprint/10273

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