Trudel, Sylvie and Abran, Alain.
2009.
« Functional size measurement quality challenges for inexperienced measurers ».
In Software Process and Product Measurement : International Conferences IWSM 2009 and Mensura 2009 Amsterdam, The Netherlands, November 4-6, 2009. Proceedings (Amsterdam, The Netherlands, Nov. 4-6, 2009)
Coll. « Lecture Notes in Computer Science », vol. 5891.
pp. 157-169.
Springer Berlin Heidelberg.
Compte des citations dans Scopus : 7.
Rechercher dans Google Scholar
Official URL: http://dx.doi.org/10.1007/978-3-642-05415-0_12
Item Type: | Conference proceeding |
---|---|
ISBN: | 978-3-642-05414-3 |
Editors: | Editors ORCID Abran, Alain UNSPECIFIED Braungarten, René UNSPECIFIED Dumke, Reiner R. UNSPECIFIED Cuadrado-Gallego, Juan J. UNSPECIFIED Brunekreef, Jacob UNSPECIFIED |
Professor: | Professor Abran, Alain |
Affiliation: | Génie logiciel et des technologies de l'information |
Date Deposited: | 11 Aug 2015 20:45 |
Last Modified: | 11 Aug 2015 20:45 |
URI: | https://espace2.etsmtl.ca/id/eprint/10273 |
Actions (login required)
![]() |
View Item |