Comprehensive experimental investigation of gate current limitation effects on power GaAs FETs RF performances

Constantin, Nicolas and Ghannouchi, Fadhel M.. 1995. « Comprehensive experimental investigation of gate current limitation effects on power GaAs FETs RF performances ». In IEEE MTT-S International Microwave Symposium Digest, 1995 (Orlando, FL, USA, May 16-20, 1995) pp. 717-720.
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Item Type:	Conference proceeding
ISBN:	0149-645X
Professor:	Professor Constantin, Nicolas
Affiliation:	Génie électrique
Date Deposited:	06 Nov 2015 16:19
Last Modified:	06 Nov 2015 16:19
URI:	https://espace2.etsmtl.ca/id/eprint/11792

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