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Comparative study on submillimeter flaws in stitched T-joint carbon fiber reinforced polymer by infrared thermography, microcomputed tomography, ultrasonic c-scan and microscopic inspection

Zhang, Hai, Hassler, Ulf, Genest, Marc, Fernandes, Henrique, Robitaille, François, Ibarra-Castanedo, Clemente, Joncas, Simon et Maldague, Xavier. 2015. « Comparative study on submillimeter flaws in stitched T-joint carbon fiber reinforced polymer by infrared thermography, microcomputed tomography, ultrasonic c-scan and microscopic inspection ». Optical Engineering, vol. 54, nº 10.
Compte des citations dans Scopus : 22.

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Item Type: Peer reviewed article published in a journal
Professor:
Professor
Joncas, Simon
Affiliation: Génie de la production automatisée
Date Deposited: 12 Nov 2015 21:55
Last Modified: 13 Jun 2016 13:11
URI: https://espace2.etsmtl.ca/id/eprint/11834

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