Léonard, Marc-André, Boland, Jean-François, Jégo, Christophe and Thibeault, Claude.
2015.
« Towards analysis of the radiation sensitivity of digital designs at high level of abstraction ».
In SAE 2015 AeroTech Congress & Exhibition (Seattle, WA, USA, Sept. 22-24, 2015)
Coll. « SAE Technical Papers », vol. 2015-01-2549.
SAE International.
Rechercher dans Google Scholar
Official URL: http://dx.doi.org/10.4271/2015-01-2549
Item Type: | Conference proceeding |
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Professor: | Professor Boland, Jean-François Thibeault, Claude |
Affiliation: | Génie électrique, Génie électrique |
Date Deposited: | 03 Feb 2016 20:38 |
Last Modified: | 05 Apr 2018 15:08 |
URI: | https://espace2.etsmtl.ca/id/eprint/12246 |
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