WeSPer: a flexible small delay defect quality metric

Hasib, Omar Al-Terkawi, Savaria, Yvon and Thibeault, Claude. 2016. « WeSPer: a flexible small delay defect quality metric ». In 2016 IEEE 34th VLSI Test Symposium (VTS) (Las Vegas , NV, USA, Apr. 25-27, 2016) IEEE Computer Society.
Compte des citations dans Scopus : 5.

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Item Type:	Conference proceeding
Professor:	Professor Thibeault, Claude
Affiliation:	Génie électrique
Date Deposited:	21 Jun 2016 15:02
Last Modified:	21 Jun 2016 15:02
URI:	https://espace2.etsmtl.ca/id/eprint/12838

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