Souari, Anis, Thibeault, Claude, Blaquiere, Yves et Velazco, Raoul.
2016.
« Towards an efficient SEU effects emulation on SRAM-based FPGAs ».
Microelectronics Reliability, vol. 66.
pp. 173-182.
Compte des citations dans Scopus : 1.
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Official URL: http://dx.doi.org/10.1016/j.microrel.2016.09.007
Item Type: | Peer reviewed article published in a journal |
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Professor: | Professor Thibeault, Claude Blaquière, Yves |
Affiliation: | Génie électrique, Génie électrique |
Date Deposited: | 16 Dec 2016 14:50 |
Last Modified: | 12 Sep 2018 22:59 |
URI: | https://espace2.etsmtl.ca/id/eprint/14153 |
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