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Cost analysis of a new algorithmic-based soft-error tolerant architecture

Blaquière, Yves, Gagné, Gabriel, Savaria, Yvon et Évéquoz, Claude. 1995. « Cost analysis of a new algorithmic-based soft-error tolerant architecture ». In IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems (DFT'95) (Lafayette, LA, USA, Nov. 13-15, 1995), pp. 189-197. IEEE.

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Item Type: Conference proceeding
Professor:
Professor
Blaquière, Yves
Affiliation: Autres
Date Deposited: 21 Feb 2017 14:56
Last Modified: 21 Feb 2017 14:56
URI: https://espace2.etsmtl.ca/id/eprint/14631

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