Cost analysis of a new algorithmic-based soft-error tolerant architecture

Blaquière, Yves, Gagné, Gabriel, Savaria, Yvon et Évéquoz, Claude. 1995. « Cost analysis of a new algorithmic-based soft-error tolerant architecture ». In IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems (DFT'95) (Lafayette, LA, USA, Nov. 13-15, 1995) pp. 189-197. IEEE.

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Item Type:	Conference proceeding
ISBN:	10636722
Professor:	Professor Blaquière, Yves
Affiliation:	Autres
Date Deposited:	21 Feb 2017 14:56
Last Modified:	21 Feb 2017 14:56
URI:	https://espace2.etsmtl.ca/id/eprint/14631

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