Blaquière, Yves, Gagné, Gabriel, Savaria, Yvon et Évéquoz, Claude.
1995.
« Cost analysis of a new algorithmic-based soft-error tolerant architecture ».
In IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems (DFT'95) (Lafayette, LA, USA, Nov. 13-15, 1995)
pp. 189-197.
IEEE.
Rechercher dans Google Scholar
Official URL: https://doi.org/10.1109/dftvs.1995.476952
| Item Type: | Conference proceeding | ||
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| ISBN: | 10636722 | ||
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| Affiliation: | Autres | ||
| Date Deposited: | 21 Feb 2017 14:56 | ||
| Last Modified: | 21 Feb 2017 14:56 | ||
| URI: | https://espace2.etsmtl.ca/id/eprint/14631 |
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