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Digital measurement technique for capacitance variation detection on integrated circuit I/Os

Blaquière, Yves, Savaria, Yvon et Fouladi, Jaouad El. 2007. « Digital measurement technique for capacitance variation detection on integrated circuit I/Os ». In 14th IEEE International Conference on Electronics, Circuits and Systems (ICECS) (Marrakech, Morocco, Dec. 11-14, 2007) pp. 42-45. IEEE.
Compte des citations dans Scopus : 7.

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Item Type: Conference proceeding
Professor:
Professor
Blaquière, Yves
Affiliation: Autres
Date Deposited: 21 Feb 2017 14:57
Last Modified: 21 Feb 2017 14:57
URI: https://espace2.etsmtl.ca/id/eprint/14634

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