Blaquière, Yves, Savaria, Yvon and Fouladi, Jaouad El.
2007.
« Digital measurement technique for capacitance variation detection on integrated circuit I/Os ».
In 14th IEEE International Conference on Electronics, Circuits and Systems (ICECS) (Marrakech, Morocco, Dec. 11-14, 2007)
pp. 42-45.
IEEE.
Compte des citations dans Scopus : 8.
Rechercher dans Google Scholar
Official URL: http://dx.doi.org/10.1109/ICECS.2007.4510926
Item Type: | Conference proceeding |
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Professor: | Professor Blaquière, Yves |
Affiliation: | Autres |
Date Deposited: | 21 Feb 2017 14:57 |
Last Modified: | 21 Feb 2017 14:57 |
URI: | https://espace2.etsmtl.ca/id/eprint/14634 |
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