Bougataya, Mohammed, Lakhsasi, Ahmed, Norman, Richard, Prytula, Richard, Blaquière, Yves et Savaria, Yvon.
2008.
« Steady state thermal analysis of a reconfigurable wafer-scale circuit board ».
In IEEE Canadian Conference on Electrical and Computer Engineering (CCECE) (Niagara Falls, ON, Canada, May 04-07, 2008)
pp. 411-415.
IEEE.
Compte des citations dans Scopus : 5.
Rechercher dans Google Scholar
Official URL: http://dx.doi.org/10.1109/CCECE.2008.4564567
Item Type: | Conference proceeding | ||
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ISBN: | 08407789 | ||
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Affiliation: | Autres | ||
Date Deposited: | 21 Feb 2017 14:57 | ||
Last Modified: | 21 Feb 2017 14:57 | ||
URI: | https://espace2.etsmtl.ca/id/eprint/14636 |
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