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Steady state thermal analysis of a reconfigurable wafer-scale circuit board

Bougataya, Mohammed, Lakhsasi, Ahmed, Norman, Richard, Prytula, Richard, Blaquière, Yves et Savaria, Yvon. 2008. « Steady state thermal analysis of a reconfigurable wafer-scale circuit board ». In IEEE Canadian Conference on Electrical and Computer Engineering (CCECE) (Niagara Falls, ON, Canada, May 04-07, 2008) pp. 411-415. IEEE.
Compte des citations dans Scopus : 5.

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Item Type: Conference proceeding
ISBN: 08407789
Professor:
Professor
Blaquière, Yves
Affiliation: Autres
Date Deposited: 21 Feb 2017 14:57
Last Modified: 21 Feb 2017 14:57
URI: https://espace2.etsmtl.ca/id/eprint/14636

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