Faults diagnosis methodology for the waferNet interconnection network

Basile-Bellavance, Yan, Blaquière, Yves and Savaria, Yvon. 2009. « Faults diagnosis methodology for the waferNet interconnection network ». In Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference (NEWCAS-TAISA) (Toulouse, France, June 28-July 01, 2009) IEEE Computer Society.
Compte des citations dans Scopus : 7.

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Item Type:	Conference proceeding
Professor:	Professor Blaquière, Yves
Affiliation:	Autres
Date Deposited:	21 Feb 2017 14:58
Last Modified:	21 Feb 2017 14:58
URI:	https://espace2.etsmtl.ca/id/eprint/14640

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