FRANÇAIS
A showcase of ÉTS researchers’ publications and other contributions
SEARCH

Faults diagnosis methodology for the waferNet interconnection network

Basile-Bellavance, Yan, Blaquière, Yves et Savaria, Yvon. 2009. « Faults diagnosis methodology for the waferNet interconnection network ». In Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference (NEWCAS-TAISA) (Toulouse, France, June 28-July 01, 2009) IEEE Computer Society.
Compte des citations dans Scopus : 6.

The full text of this document is not available here.
Rechercher dans Google Scholar
Item Type: Conference proceeding
Professor:
Professor
Blaquière, Yves
Affiliation: Autres
Date Deposited: 21 Feb 2017 14:58
Last Modified: 21 Feb 2017 14:58
URI: https://espace2.etsmtl.ca/id/eprint/14640

Actions (login required)

View Item View Item