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Design and validation of a novel reconfigurable and defect tolerant JTAG scan chain

Blaquière, Yves, Basile-Bellavance, Yan, Berrima, Safa et Savaria, Yvon. 2014. « Design and validation of a novel reconfigurable and defect tolerant JTAG scan chain ». In IEEE International Symposium on Circuits and Systems (ISCAS) (Melbourne, VIC, Australia, June 01-05, 2014) pp. 2559-2562. IEEE.
Compte des citations dans Scopus : 6.

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Item Type: Conference proceeding
ISBN: 02714310
Professor:
Professor
Blaquière, Yves
Affiliation: Autres
Date Deposited: 21 Feb 2017 14:53
Last Modified: 21 Feb 2017 14:53
URI: https://espace2.etsmtl.ca/id/eprint/14659

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