Design and validation of a novel reconfigurable and defect tolerant JTAG scan chain

Blaquière, Yves, Basile-Bellavance, Yan, Berrima, Safa and Savaria, Yvon. 2014. « Design and validation of a novel reconfigurable and defect tolerant JTAG scan chain ». In IEEE International Symposium on Circuits and Systems (ISCAS) (Melbourne, VIC, Australia, June 01-05, 2014) pp. 2559-2562. IEEE.
Compte des citations dans Scopus : 6.

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Item Type:	Conference proceeding
ISBN:	02714310
Professor:	Professor Blaquière, Yves
Affiliation:	Autres
Date Deposited:	21 Feb 2017 14:53
Last Modified:	21 Feb 2017 14:53
URI:	https://espace2.etsmtl.ca/id/eprint/14659

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