Sion, Gontran, Blaquière, Yves et Savaria, Yvon.
2015.
« Defect diagnosis algorithms for a field programmable interconnect network embedded in a very large area integrated circuit ».
In 21st IEEE International On-Line Testing Symposium (IOLTS) (Halkidiki, Greece, July 06-08, 2015)
pp. 83-88.
IEEE.
Compte des citations dans Scopus : 3.
Rechercher dans Google Scholar
Official URL: http://dx.doi.org/10.1109/IOLTS.2015.7229837
Item Type: | Conference proceeding | ||
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Affiliation: | Autres | ||
Date Deposited: | 21 Feb 2017 14:53 | ||
Last Modified: | 21 Feb 2017 14:53 | ||
URI: | https://espace2.etsmtl.ca/id/eprint/14660 |
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