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Defect diagnosis algorithms for a field programmable interconnect network embedded in a very large area integrated circuit

Sion, Gontran, Blaquière, Yves et Savaria, Yvon. 2015. « Defect diagnosis algorithms for a field programmable interconnect network embedded in a very large area integrated circuit ». In 21st IEEE International On-Line Testing Symposium (IOLTS) (Halkidiki, Greece, July 06-08, 2015) pp. 83-88. IEEE.
Compte des citations dans Scopus : 3.

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Item Type: Conference proceeding
Professor:
Professor
Blaquière, Yves
Affiliation: Autres
Date Deposited: 21 Feb 2017 14:53
Last Modified: 21 Feb 2017 14:53
URI: https://espace2.etsmtl.ca/id/eprint/14660

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