Functional size measurement patterns: A proposed approach

Trudel, Sylvie, Desharnais, Jean-Marc and Cloutier, Jimmy. 2016. « Functional size measurement patterns: A proposed approach ». In 26th International Workshop on Software Measurement and the 11th International Conference on Software Process and Product Measurement (IWSM-Mensura) (Berlin, Germany, Oct. 05-07, 2016) pp. 23-34. IEEE.
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Item Type:	Conference proceeding
Professor:	Professor Desharnais, Jean-Marc
Affiliation:	Génie logiciel et des technologies de l'information
Date Deposited:	08 Jun 2017 19:30
Last Modified:	08 Jun 2017 19:30
URI:	https://espace2.etsmtl.ca/id/eprint/15317

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