On the use of ISO/IEC standards to address data quality aspects in big data analytics cloud services

Roy, Jonathan, Terfas, Hebatalla et Suryn, Witold. 2017. « On the use of ISO/IEC standards to address data quality aspects in big data analytics cloud services ». In 20th International Conference on Business Information Systems (BIS) 2017, June 28, 2017 - June 30, 2017 (Poznan, Poland, June 28-30, 2017) Coll. « Lecture Notes in Business Information Processing », vol. 288. pp. 149-164. Springer Verlag.
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Official URL: http://dx.doi.org/10.1007/978-3-319-59336-4_11

Item Type:

Conference proceeding

ISBN:

18651348

Editors:

Editors	ORCID
Abramowicz, Witold	UNSPECIFIED

Professor:

Professor
Suryn, Witold

Affiliation:

Génie logiciel et des technologies de l'information

Date Deposited:

24 Aug 2017 15:41

Last Modified:

24 Aug 2017 15:41

URI:

https://espace2.etsmtl.ca/id/eprint/15698

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