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On the use of ISO/IEC standards to address data quality aspects in big data analytics cloud services

Roy, Jonathan, Terfas, Hebatalla et Suryn, Witold. 2017. « On the use of ISO/IEC standards to address data quality aspects in big data analytics cloud services ». In 20th International Conference on Business Information Systems (BIS) 2017, June 28, 2017 - June 30, 2017 (Poznan, Poland, June 28-30, 2017) Coll. « Lecture Notes in Business Information Processing », vol. 288. pp. 149-164. Springer Verlag.
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Item Type: Conference proceeding
ISBN: 18651348
Editors:
EditorsORCID
Abramowicz, WitoldUNSPECIFIED
Professor:
Professor
Suryn, Witold
Affiliation: Génie logiciel et des technologies de l'information
Date Deposited: 24 Aug 2017 15:41
Last Modified: 24 Aug 2017 15:41
URI: https://espace2.etsmtl.ca/id/eprint/15698

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