Roy, Jonathan, Terfas, Hebatalla et Suryn, Witold.
2017.
« On the use of ISO/IEC standards to address data quality aspects in big data analytics cloud services ».
In 20th International Conference on Business Information Systems (BIS) 2017, June 28, 2017 - June 30, 2017 (Poznan, Poland, June 28-30, 2017)
Coll. « Lecture Notes in Business Information Processing », vol. 288.
pp. 149-164.
Springer Verlag.
Compte des citations dans Scopus : 1.
The full text of this document is not available here.
Item Type: |
Conference proceeding
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ISBN: |
18651348 |
Editors: |
Abramowicz, Witold | UNSPECIFIED |
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Professor: |
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Affiliation: |
Génie logiciel et des technologies de l'information |
Date Deposited: |
24 Aug 2017 15:41 |
Last Modified: |
24 Aug 2017 15:41 |
URI: |
https://espace2.etsmtl.ca/id/eprint/15698 |
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