On the use of ISO/IEC standards to address data quality aspects in big data analytics cloud services

Roy, Jonathan, Terfas, Hebatalla et Suryn, Witold. 2017. « On the use of ISO/IEC standards to address data quality aspects in big data analytics cloud services ». In 20th International Conference on Business Information Systems (BIS) 2017, June 28, 2017 - June 30, 2017 (Poznan, Poland, June 28-30, 2017) Coll. « Lecture Notes in Business Information Processing », vol. 288. pp. 149-164. Springer Verlag.
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Item Type:	Conference proceeding
ISBN:	18651348
Editors:	Editors ORCID Abramowicz, Witold UNSPECIFIED
Professor:	Professor Suryn, Witold
Affiliation:	Génie logiciel et des technologies de l'information
Date Deposited:	24 Aug 2017 15:41
Last Modified:	24 Aug 2017 15:41
URI:	https://espace2.etsmtl.ca/id/eprint/15698

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