Analysis of backscattered ultrasound amplitude of Ti-5.8Al-4Sn-3.5Zr-0.7Nb-0.5Mo-0.3Si samples in terms of their microstructures and local textures

Humbert, M., Moreau, A., Uta, E., Gey, N., Bocher, Philippe and Bescond, C.. 2009. « Analysis of backscattered ultrasound amplitude of Ti-5.8Al-4Sn-3.5Zr-0.7Nb-0.5Mo-0.3Si samples in terms of their microstructures and local textures ». Acta Materialia, vol. 57, nº 3. pp. 708-714.
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Item Type:	Peer reviewed article published in a journal
Professor:	Professor Bocher, Philippe
Affiliation:	Génie mécanique
Date Deposited:	13 Jun 2012 18:13
Last Modified:	19 Oct 2023 16:29
URI:	https://espace2.etsmtl.ca/id/eprint/1578

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