Charfi, F., Messaoud, M. B., François, B., Al-Haddad, Kamal et Sellami, F..
2007.
« Enhanced micro modeling technique for semiconductor devices to study faulty mode in power converters ».
International Review of Electrical Engineering, vol. 2, nº 3.
pp. 327-336.
The full text of this document is not available here.
| Item Type: |
Peer reviewed article published in a journal
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| Professor: |
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| Affiliation: |
Génie électrique |
| Date Deposited: |
13 Jun 2012 18:14 |
| Last Modified: |
01 Oct 2015 20:01 |
| URI: |
https://espace2.etsmtl.ca/id/eprint/1731 |
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