Blanchard, François, Chai, Xin, Tanaka, Tomoko, Arikawa, Takashi, Ozaki, Tsuneyuki, Morandotti, Roberto et Tanaka, Koichiro.
2018.
« Terahertz microscopy assisted by semiconductor nonlinearities ».
Optics Letters, vol. 43, nº 20.
pp. 4997-5000.
Compte des citations dans Scopus : 2.
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Official URL: https://doi.org/10.1364/OL.43.004997
Item Type: | Peer reviewed article published in a journal |
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Professor: | Professor Blanchard, François |
Affiliation: | Génie électrique |
Date Deposited: | 16 Oct 2018 16:04 |
Last Modified: | 22 Jan 2020 19:31 |
URI: | https://espace2.etsmtl.ca/id/eprint/17394 |
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