Terahertz microscopy assisted by semiconductor nonlinearities

Blanchard, François, Chai, Xin, Tanaka, Tomoko, Arikawa, Takashi, Ozaki, Tsuneyuki, Morandotti, Roberto et Tanaka, Koichiro. 2018. « Terahertz microscopy assisted by semiconductor nonlinearities ». Optics Letters, vol. 43, nº 20. pp. 4997-5000.
Compte des citations dans Scopus : 2.

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Item Type:	Peer reviewed article published in a journal
Professor:	Professor Blanchard, François
Affiliation:	Génie électrique
Date Deposited:	16 Oct 2018 16:04
Last Modified:	22 Jan 2020 19:31
URI:	https://espace2.etsmtl.ca/id/eprint/17394

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