Jebali, Chokri and Kouki, Ammar.
2018.
« Thermal effects analysis of GaN HEMT power amplifier based on LTCC substrate integration ».
In 2018 IEEE Canadian Conference on Electrical & Computer Engineering (CCECE) (Québec, QC, Canada, May 13-16, 2018)
Piscataway, NJ, USA : IEEE.
Compte des citations dans Scopus : 2.
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Official URL: http://dx.doi.org/10.1109/CCECE.2018.8447758
Item Type: | Conference proceeding |
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Professor: | Professor Kouki, Ammar B. |
Affiliation: | Génie électrique |
Date Deposited: | 17 Oct 2018 20:19 |
Last Modified: | 22 Jan 2020 20:00 |
URI: | https://espace2.etsmtl.ca/id/eprint/17446 |
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