Moulins, A., Grosse, G., Esteves, A., Dugnani, R. et Zednik, R..
2018.
« Determining stresses in silicon-based microdevices using fractography ».
Affiche présentée lors de la conférence :
Nanomaterials for Devices (Montreal, QC, Canada, Sept. 10-12, 2018).
The full text of this document is not available here.
| Item Type: |
Poster
|
| Additional Information: |
Le résumé de l'affiche est disponible à la page 48 de Nanomaterials for devices : Italy/Canada Bilateral Workshop : Abstracts http://nanomaterialsfordevices.ism.cnr.it/wp-content/uploads/2018/09/Book-of-abstracts.pdf |
| Professor: |
|
| Affiliation: |
Génie mécanique |
| Date Deposited: |
05 Nov 2018 18:57 |
| Last Modified: |
22 Jan 2020 20:17 |
| URI: |
https://espace2.etsmtl.ca/id/eprint/17485 |
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