Amirkhan, F., Sakata, R., Takiguchi, K., Arikawa, T., Ozaki, T., Tanaka, K. et Blanchard, F..
2019.
« Characterization of thin film materials using near field THz imaging ».
In 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW) (Paris, France, Sept. 01-06, 2019)
IEEE.
Rechercher dans Google Scholar
Official URL: https://doi.org/10.1109/IRMMW-THz.2019.8874460
| Item Type: | Conference proceeding |
|---|---|
| Professor: | Professor Blanchard, François |
| Affiliation: | Génie électrique |
| Date Deposited: | 06 Aug 2019 18:34 |
| Last Modified: | 22 Jan 2020 19:31 |
| URI: | https://espace2.etsmtl.ca/id/eprint/19074 |
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