Near-field imaging of terahertz nonlinearities in doped semiconductor thin film

Blanchard, François and Tanaka, K.. 2019. « Near-field imaging of terahertz nonlinearities in doped semiconductor thin film ». In International congress on advanced Materials Sciences and Engineering (AMSE) (Osaka, Japan, July 22-24, 2019)

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Item Type:	Conference proceeding
Professor:	Professor Blanchard, François
Affiliation:	Génie électrique
Date Deposited:	06 Aug 2019 18:34
Last Modified:	22 Jan 2020 19:31
URI:	https://espace2.etsmtl.ca/id/eprint/19075

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