Blanchard, François. 2019. « Material characterization using 2D near-field THz imaging ». Communication lors de la conférence : International Workshop on Terahertz Technology (IWOTT) (Lake Louise, AB, Canada, 12-15 avril 2019).
The full text of this document is not available here.| Item Type: | Communication (Communication) |
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| Additional Information: | Conférencier invité |
| Professor: | Professor Blanchard, François |
| Affiliation: | Génie électrique |
| Date Deposited: | 08 Aug 2019 13:41 |
| Last Modified: | 22 Jan 2020 19:31 |
| URI: | https://espace2.etsmtl.ca/id/eprint/19081 |
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