Diffracting-grain identification from electron backscatter diffraction maps during residual stress measurements: a comparison between the sin2ψ and cosα methods

Delbergue, Dorian, Texier, Damien, Lévesque, Martin and Bocher, Philippe. 2019. « Diffracting-grain identification from electron backscatter diffraction maps during residual stress measurements: a comparison between the sin2ψ and cosα methods ». Journal of Applied Crystallography, vol. 52, nº 4. pp. 828-843.
Compte des citations dans Scopus : 11.

The full text of this document is not available here.

Item Type:	Peer reviewed article published in a journal
Professor:	Professor Bocher, Philippe
Affiliation:	Génie mécanique
Date Deposited:	04 Oct 2019 18:49
Last Modified:	04 Oct 2019 18:49
URI:	https://espace2.etsmtl.ca/id/eprint/19504

Actions (login required)

View Item