Al-Terkawi Hasib, Omar, Savaria, Yvon and Thibeault, Claude.
2019.
« Multi-PVT-point analysis and comparison of recent small-delay defect quality metrics ».
Journal of Electronic Testing: Theory and Applications, vol. 35, nº 6.
pp. 823-838.
Compte des citations dans Scopus : 1.
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Official URL: https://doi.org/10.1007/s10836-019-05832-w
| Item Type: | Peer reviewed article published in a journal |
|---|---|
| Professor: | Professor Thibeault, Claude |
| Affiliation: | Génie électrique |
| Date Deposited: | 22 Jan 2020 18:46 |
| Last Modified: | 07 Sep 2024 17:36 |
| URI: | https://espace2.etsmtl.ca/id/eprint/20051 |
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