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Multi-PVT-point analysis and comparison of recent small-delay defect quality metrics

Al-Terkawi Hasib, Omar, Savaria, Yvon et Thibeault, Claude. 2019. « Multi-PVT-point analysis and comparison of recent small-delay defect quality metrics ». Journal of Electronic Testing: Theory and Applications (JETTA), vol. 35. pp. 823-838.

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Item Type: Peer reviewed article published in a journal
Professor:
Professor
Thibeault, Claude
Affiliation: Génie électrique
Date Deposited: 22 Jan 2020 18:46
Last Modified: 10 Dec 2020 21:09
URI: https://espace2.etsmtl.ca/id/eprint/20051

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