Hasib, Omar Al-Terkawi, Savaria, Yvon et Thibeault, Claude.
2020.
« Optimization of small-delay defects test quality by clock speed selection and proper masking based on the weighted slack percentage ».
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 28, nº 3.
pp. 764-776.
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Official URL: http://dx.doi.org/10.1109/TVLSI.2019.2949037
Item Type: | Peer reviewed article published in a journal | ||
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Affiliation: | Génie électrique | ||
Date Deposited: | 16 Apr 2020 16:27 | ||
Last Modified: | 16 Apr 2020 16:27 | ||
URI: | https://espace2.etsmtl.ca/id/eprint/20450 |
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