Optimization of small-delay defects test quality by clock speed selection and proper masking based on the weighted slack percentage

Hasib, Omar Al-Terkawi, Savaria, Yvon et Thibeault, Claude. 2020. « Optimization of small-delay defects test quality by clock speed selection and proper masking based on the weighted slack percentage ». IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 28, nº 3. pp. 764-776.

The full text of this document is not available here.

Item Type:	Peer reviewed article published in a journal
Professor:	Professor Thibeault, Claude
Affiliation:	Génie électrique
Date Deposited:	16 Apr 2020 16:27
Last Modified:	16 Apr 2020 16:27
URI:	https://espace2.etsmtl.ca/id/eprint/20450

Actions (login required)

View Item