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Specification and detection of business process antipatterns

Palma, Francis, Moha, Naouel et Guéhéneuc, Yann-Gäel. 2015. « Specification and detection of business process antipatterns ». In E-Technologies : 6th International Conference, MCETECH : Proceedings (Montréal, QC, Canada, May 12-15, 2015) Coll. « Lecture Notes in Business Information Processing », vol. 209. pp. 37-52. Springer Verlag.

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Item Type: Conference proceeding
ISBN: 18651348 (ISSN); 9783319179568 (ISBN)
Editors:
EditorsORCID
Weiss, M.UNSPECIFIED
Benyoucef, M.UNSPECIFIED
Mili, H.UNSPECIFIED
Additional Information: 6th International Conference on E-Technologies (MCETECH)
Professor:
Professor
Moha, Naouel
Affiliation: Autres
Date Deposited: 21 Oct 2020 20:19
Last Modified: 21 Oct 2020 20:19
URI: https://espace2.etsmtl.ca/id/eprint/21246

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