An accurate on-wafer deembedding technique with application to HBT devices characterization

Bousnina, Sami, Falt, Chris, Mandeville, Pierre, Kouki, Ammar B. and Ghannouchi, Fadhel M.. 2002. « An accurate on-wafer deembedding technique with application to HBT devices characterization ». IEEE Transactions on Microwave Theory and Techniques, vol. 50, nº 2. pp. 420-424.
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Item Type:	Peer reviewed article published in a journal
Professor:	Professor Kouki, Ammar B.
Affiliation:	Génie électrique
Date Deposited:	29 Oct 2012 20:47
Last Modified:	29 Oct 2012 20:47
URI:	https://espace2.etsmtl.ca/id/eprint/2152

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