Thibeault, Claude.
2003.
« On faster IDDQ measurements ».
Journal of Electronic Testing, vol. 19, nº 6.
pp. 625-635.
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Official URL: http://dx.doi.org/10.1023/A:1027418704942
Item Type: | Peer reviewed article published in a journal |
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Professor: | Professor Thibeault, Claude |
Affiliation: | Génie électrique |
Date Deposited: | 29 Oct 2012 20:47 |
Last Modified: | 29 Oct 2012 20:47 |
URI: | https://espace2.etsmtl.ca/id/eprint/2228 |
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