Replacing IDDQ testing: with variance reduction

Thibeault, Claude. 2003. « Replacing IDDQ testing: with variance reduction ». Journal of Electronic Testing, vol. 19, nº 3. pp. 325-340.
Compte des citations dans Scopus : 9.

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Item Type:	Peer reviewed article published in a journal
Professor:	Professor Thibeault, Claude
Affiliation:	Génie électrique
Date Deposited:	29 Oct 2012 20:47
Last Modified:	29 Oct 2012 20:47
URI:	https://espace2.etsmtl.ca/id/eprint/2229

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