Thibeault, Claude.
2003.
« Replacing IDDQ testing: with variance reduction ».
Journal of Electronic Testing, vol. 19, nº 3.
pp. 325-340.
Compte des citations dans Scopus : 9.
Rechercher dans Google Scholar
Official URL: http://dx.doi.org/10.1023/A:1023761416156
Item Type: | Peer reviewed article published in a journal | ||
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Affiliation: | Génie électrique | ||
Date Deposited: | 29 Oct 2012 20:47 | ||
Last Modified: | 29 Oct 2012 20:47 | ||
URI: | https://espace2.etsmtl.ca/id/eprint/2229 |
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