Thibeault, Claude, Savaria, Yvon et Houle, Jean louis.
1994.
« A fast method to evaluate the optimum number of spares in defect-tolerant integrated-circuits ».
IEEE Transactions on Computers, vol. 43, nº 6.
pp. 687-697.
Compte des citations dans Scopus : 3.
Rechercher dans Google Scholar
Official URL: http://dx.doi.org/10.1109/12.286302
Item Type: | Peer reviewed article published in a journal | ||
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Affiliation: | Génie électrique | ||
Date Deposited: | 29 Oct 2012 20:47 | ||
Last Modified: | 29 Oct 2012 20:47 | ||
URI: | https://espace2.etsmtl.ca/id/eprint/2231 |
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