Amyot, N., David, Éric, Lee, S. Y. and Lee, I. H..
2002.
« Influence of post-manufacturing residual mechanical stress and crosslinking by-products on dielectric strength of HV extruded cables ».
IEEE Transactions on Dielectrics and Electrical Insulation, vol. 9, nº 3.
pp. 458-466.
Compte des citations dans Scopus : 29.
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Official URL: http://dx.doi.org/10.1109/tdei.2002.1007710
Item Type: | Peer reviewed article published in a journal |
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Professor: | Professor David, Éric |
Affiliation: | Génie mécanique |
Date Deposited: | 29 Oct 2012 20:47 |
Last Modified: | 29 Oct 2012 20:47 |
URI: | https://espace2.etsmtl.ca/id/eprint/2250 |
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